Introduction
Silicon wafers are the
basic raw material from which transistors, integrated circuits,
memory chips, microprocessors and various other semiconductor
devices are made, for use in electronics, familiar to us in
everyday use. Wafers are made from ultra pure silicon,
crystallized by the
Czochralski or Float Zone
methods, into single crystal ingots. These ingots are sliced into
thin wafers, then lapped, etched, polished and cleaned, to become
the purest, flattest, smoothest and cleanest objects possible.
Only such perfections can yields the billions of submicroscopic
transistors that make up modern semiconductor devices.
From sand to ingot
Silicon (at 27%) is the second most abundant element in earth's
crust (after oxygen). It is never found as the elemental silicon,
but as the compound SiO2. It is the main constituent of sand and
many rocks.
Semiconductor applications of silicon require extraction and
purification of this element to level of ~99.9999999% (9N).
It takes the following three energy-consuming steps:
(From sand to ingot)
Sand to Metallurgical grade Silicon
|
Metalurgical to Semiconductor grade Silicon (Siemens
process)
|
Monocrystalline Silicon ingots |
Naturally occurring silica sand (at least 98% SiO2) is mined
where convenient for transport by ships (eg. Mexico), and
carried to where hydroelectric power is plentiful and cheap
(eg. west coast of Norway). There it is charged into
electric arc furnaces with massive carbon electrodes where
at a high temperature Silicon is produced according to
SiO2+2C→Si+2CO This is metallurgical grade
Silicon (99% pure) for use in hardening of Aluminium and
Steel.
|
Metallurgical grade Silicon is reacted with hydrogen
chloride to produce compounds of Silicon, Chlorine and
Hydrogen typically: Si+3HCl→SiHCL3+H2
(called Trichlorosilane or TCS), which is a liquid, is then
distilled through many stages from initial 2N to the amazing
9N purity. Ultra-pure TCS vapour is pumped over Silicon rods
heated to 1,150ºC where it dissociates and Silicon deposits
on the rods as tiny crystals. Remaining volatile compounds
are redistilled and recycled. The silicon rods, when grown
to 100mmØ or 200mmØ, are removed and used for FZ
crystallization or crushed into smaller chunks for use in
the CZ crystallization process. This is the Siemens process,
which is most widely used to make semiconductor grade
Silicon.
|
The polycrystalline silicon is recrystallized into
monocrystalline ingots. The most commonly used is the
Czochralski (CZ) process. In it the polysilicon chunks and an appropriate dopant
are charged into a quartz crucible and melted under Argon in
an electric furnace. A seed crystal is inserted then slowly
rotated and withdrawn while the Silicon crystallizes about
it, forming a cylindrical monocrystalline ingot of desired
diameter of up to Ø300mm or even Ø450mm. Crystallographic
orientation of the ingot is that of the seed crystal {(100),
(111), (110) or (211)}. The dopant added in a small but
precise amount of Boron or Phosphorus or Antimony or Arsenic
which gives the material specific type and degree of
electrical conductivity. The floating zone (FZ) technique is
a crucible-free crystal growth method. In FZ growth, the
molten zone is kept between two vertical solid rods by its
own surface tension. Dopant is introduced by blowing a gas
containing the dopant element into the melt zone. FZ is used
only for very high resistivity ingots or to avoid the trace
amounts of Oxygen that dissolve into Silicon from the quartz
crucible in CZ method.
|
From ingot to wafer
Silicon ingots are made in various sizes (commonly in nominal
diameters of 1", 2", 3", 100mm, 125mm, 150mm, 200mm, 300mm and
450mm). They are either CZ or FZ crystallized. Ingot
crystallographic orientations are usually (100) or (111) and
sometimes (110) or (211). Silicon ingots are doped with Boron (B)
to have p-type resistivity of anywhere from 0.001 to 10,000 Ohmcm
{most commonly (1-10)}. To have n-type resistivity Silicon is
doped with Phosphorus. Resistivities from 0.001 to 10,000 Ohmcm
are possible, but resistivities below 0.1 Ohmcm require certain
safety precautions in manufacture. Antimony (Sb) is used to dope
Silicon to n-type (0.008-0.020)Ohmcm and Arsenic (As) to dope
Silicon to n-type (0.001-0.005)Ohmcm. Undoped (intrinsic) Silicon
ingots can have resistivity > 20,000 Ohmcm and then type is
indeterminate. CZ crystallized Silicon ingots Boron doped to
(0.1-100)Ohmcm range, have to be heat treated (quenched) after
crystallization to eliminate Boron-Oxygen complexes that grow
during slow cooling. This is done routinely for ingots not more
than 4"Ø. Such material more than 4"Ø, has to be heat treated as
wafers after slicing, since large ingots cannot be cooled fast
enough. All electronic properties of Silicon wafers are determined
in the manufacture of ingots. Wafer manufacture affects only the
geometric properties and crystallographic parameters of wafers.
Silicon ingots are made into Silicon wafers in the following
precision major manufacturing steps (more details are in
this picture):
(From ingot to wafer)
Ingot slicing |
Wafer edge rounding |
Wafers lapping & etching
|
Wafers polishing |
Ingots, after the growth, are top and tail cropped, grounded
to the diameter and sliced into wafers. There are two
slicing methods in use, wire slicing, commonly used in a
mass production and ID slicing, apllied for short series.
During slicing the ingots are often tilted from their axis
to create off-oriented wafers. Off orientation is crucial
for some applications (e.g. to zero diffraction plates for
X-ray), also improves smooth epitaxial growth of silicon on
silicon layers.
|
To prevent chipping, the sharp edge of the wafer is grinded
to the round shape. There are many edge shapes are possible
and applied for different applications. Long, sharp edges
improves smooth epitaxial silicon growth, and are often
apllied for substrates used for thick epi layer
(>20µm). Trapesoidal edge shape is used for very
thick wafers (>3000µm). Such wafers 'sliced and
edge-rounded wafers' are called 'as-cut' wafer.
|
The wafers are sorted into thickness groups, loaded into
batch lapping machines and lapped. Quartz based and fine
lapping powders are used. After the process the wafer are
uniform in thickness, surface appereance and shape but
require etching to remove all subsurface mechanical damages.
Two types of etching are in common use: alkalline (with KOH
solution use) and acid (with HNO3,
CH3COOH and HF mixture). Wafers after these
processes are called "as-etched". "As-etched" wafers are
good enough to be used as the start wafers to produce
devices (e.g. thyristors).
|
But majority of the aplications require smoother,
mirror-like polished surface, with Ra less than 5 Angstroms.
To achieve such surface, Si wafers are
chemical-mechanical-polished. In a standard process, Si
wafers are often polished adhering to polishing blocks, one
side at a time. The coplanar polishing is a silicon wafers
chemical-mechanical-polishing technique with a
double-side-polisher in which both wafer sides are polished
at the same time. Polished wafers are wet cleaned and spin
dried. Now they are ready for epitaxial layers deposition.
|
Epitaxial processes
The term epitaxy comes from the ancient Greek roots epi (ἐπί),
meaning „above”and taxis (τάξις), meaning „an ordered manner”. It
can be translated as "arranging upon". For most technological
applications, it is desired that the deposited material form a
crystalline overlayer that has one well-defined orientation with
respect to the substrate crystal structure (single-domain
epitaxy). Chemical vapor deposition (CVD) is a key technology used
to produce high quality, high-performance, solid materials. The
process is used in the semiconductor industry to produce thin
films. In typical CVD, the wafer (substrate) is exposed to one or
more volatile precursors, which react and/or decompose on the
substrate surface to produce the desired deposit. Frequently,
volatile by-products are also produced, which are removed by gas
flow through the reaction chamber.
(Epitaxy)
Back side protection |
Reactor types |
Silicon sources |
Epitaxial Si layer, during the growth, is doped in a
controled way, from gas present in ambient atmosphere. The
most common are phosphin (PH3) or diboran
(B2H4). However, the dopant atoms also
migrate from the substrate to the layer, additionally doping
the layer, in unwonted way. To prevent this "auto-doping"
phenomaena the wafers shall be protected on the backsides.
The protection is made by adding additional layer on the
wafer's backside. It can be sealing oxide layer or
polysilicon layer or sometimes super sealing oxide and poly
together.
|
In common use there are 3 types of silicon on silicon epi
reactors: batch reactors: barrel (where wafers are standing
vertically) or pan-cake (wafers are in a horisontal) single
wafer reactors (pan-cake type but for one wafer only).
|
The sources of silicon for epi are ususally:
Trichlorosilan:
SiHCl3+H2→↓Si+3HCl
Tetrachloride:
SiCl4+2H2→↓Si+4HCl
The advantage of using SiHCl3 to SiCl4
is lower process temperature about 1090 °C to about 1115
°C adequately.
|
Silicon properties
Silicon, Si - the most common semiconductor,
single crystal Si can be processed into wafers up to 450 mm in
diameter. Wafers are thin (thickness depends on wafer diameter,
but is typically less than 1 mm), circular slice of single-crystal
semiconductor material cut from the ingot of single crystal
semiconductor. All lattice planes and lattice directions are
described by a mathematical description known as a Miller Index.
In the cubic lattice system, the direction [hkl] defines a vector
direction normal to surface of a particular plane or facet. A
crystal can always be divided into a fundamental shape with a
characteristic shape, volume, and contents.
As a crystal is periodic, there exist families of equivalent
directions and planes. Notation allows for distinction between a
specific direction or plane and families of such. Miller
convention:
- Use the [ ] notation to identify a specific direction,
-
Use the < > notation to identify a family of equivalent
directions,
- Use the ( ) notation to identify a specific plane,
-
Use the { } notation to identify a family of equivalent planes.
Crystal Properties
Property |
Value |
Units |
Structure |
Cubic |
|
Space Group |
Fd3m |
|
Atomic weight |
28.0855 |
|
Lattice spacing (a0) at 300K
|
0.54311 |
nm |
Density at 300K |
2.3290 |
g/cm3 |
Nearest Neighbour Distance at 300K |
0.235 |
nm |
Number of atoms in 1 cm3 |
4.995×1022 |
|
Isotopes |
28 (92.23%)
29 (4.67%)
30 (3.10%)
|
|
Electron Shells |
1s22s22p63s23p2
|
|
Common Ions |
Si 4 +, Si 4 - |
|
Critical Pressure |
1450 |
atm |
Critical Temperature |
4920 |
°C |
Band Structure Properties
Property |
Value |
Units |
Dielectric Constant at 300 K (Relative Permittivity
(εr))
|
11.7 |
|
Dielectric Strength |
100 - 700 |
(V/mil) |
Loss Tangent |
0.005 (at 1 GHz) 0.015 (at 10 GHz) |
|
Effective density of states (conduction, Nc T=300
K )
|
2.8×1019 |
cm-3 |
Effective density of states (valence, Nv T=300 K
)
|
1.04×1019 |
cm-3 |
Electron affinity |
133.6 |
kJ / mol |
Energy Gap Eg at 300 K (Minimum Indirect Energy
Gap at 300 K)
|
1.12 |
eV |
Energy Gap Eg at ca. 0 K (Minimum Indirect Energy
Gap at 0K)
|
1.17 (at 0 K) |
eV |
Minimum Direct Energy Gap at 300 K |
3.4 |
eV |
Energy separation (EΓL)
|
4.2 |
eV |
Intrinsic Debye length |
24 |
µm |
Intrinsic carrier concentration at 300K
|
1×1010 |
cm-3 |
Intrinsic carrier concentration at 25°C
|
8.6×109 |
cm-3 |
Intrinsic resistivity |
3.2×105 |
Ω×cm |
Auger recombination coefficient Cn
|
1.1×10-30 |
cm6 / s |
Auger recombination coefficient Cp
|
3×10-31 |
cm6 / s |
Temperature dependence of the energy gap:
Eg = 1.17 -
4.73×10-4×T2/(T+636) (eV)
where: T is temperature in degrees K.
Thermal Properties
Property |
Value |
Units |
Melting point |
1414
1687
|
°C
K
|
Boiling point |
3538 |
K |
Specific heat |
0.7 |
J / (g × °C) |
Thermal conductivity [300K] |
148 |
W / (m × K) |
Thermal diffusivity |
0.8 |
cm2/s |
Thermal expansion, linear |
2.6×10-6 |
°C -1 |
Debye temperature |
640 |
K |
Temperature dependence of band gap |
-2.3e-4 |
eV/K |
Heat of: fusion / vaporization / atomization
|
39.6 / 383.3 / 452 |
kJ / mol |
Electrical Properties
Property |
Value |
Units |
Breakdown field |
≈ 3×105 |
V/cm |
Index of refraction |
3.42 |
|
Mobility electrons |
≈ 1400 |
cm2 / (V × s) |
Mobility holes |
≈ 450 |
cm2 / (V × s) |
Diffusion coefficient electrons |
≈ 36 |
cm2/s |
Diffusion coefficient holes |
≈ 12 |
cm2/s |
Electron thermal velocity |
2.3×105 |
m/s |
Electronegativity |
1.8 |
Pauling`s |
Hole thermal velocity |
1.65×105 |
m/s |
Optical phonon energy |
0.063 |
eV |
Density of surface atoms |
(100) 6.78
(110) 9.59
(111) 7.83
|
1014/cm2
1014/cm2
1014/cm2
|
Work function (intrinsic) |
4.15 |
eV |
Ionization Energies for Various Dopants
|
Donors:
Sb 0.039
P 0.045
As 0.054
Acceptors:
B 0.045
Al 0.067
Ga 0.072
In 0.16
|
eV
eV
eV
eV
eV
eV
eV
|
Mechanical Properties
Property |
Value |
Units |
Bulk modulus of elasticity
|
9.8×1011 |
dyn/cm2 |
Density |
2.329 |
g/cm3 |
Hardness |
7 |
on the Mohs scale |
Surface microhardness (using Knoop's pyramid test)
|
1150 |
kg/mm2 |
Elastic constants |
C11 = 16.60×1011
C12 = 6.40×1011
C44 = 7.96×1011
|
dyn/cm2
dyn/cm2
dyn/cm2
|
Young's Modulus (E) |
[100]
[110]
[111]
|
129.5
168.0
186.5
|
GPa
GPa
GPa
|
Shear Modulus |
64.1 |
GPa |
Poisson's Ratio |
0.22 to 0.28 |
- |
Resistivity & Mobility Calculator for Semiconductor Silicon
Please note:
-
To calculate Resistivity, choose Dopant and enter/modify Dopant
Density in the Dopant Density field; the Calculator will compute
Type, Resistivity and Mobility in corresponding columns.
-
To calculate Dopant Density, choose Dopant and enter/modify
Resistivity.
-
Concentration and Mobility are always computed; they cannot be
entered/modified. Likewise type is a consequence of the Dopant
chosen.
Plane Intersection Angle Calculator
References
-
Danilo Crippa, Daniel L. Rode, Maurizion Masi [Silicon Epitaxy],
Academic Press 2001
-
Robert Hull [Properties of Crystalline Silicon], INSPEC 1999
-
A. Kelly, G.W. Groves [Crystallography and crystal defects], PWN
1980
- П.С. Кириеев [Физика полупроводников], Высшая школа 1969
-
Arjan Ciftja, Thorvald Abel Engh, Merete Tangstad [Refining and
Recycling of Silicon: A Review], Norwegian University of Science
and Technology 2008
- Tadeusz Penkala [Zarys krystalografii], PWN 1977
-
On-line materials from: Bernreuter Research, Green Rhino Energy
-
Semiconductor Nanotechnology: Advances in Information and Energy
Processing and Storage - Nanostructure Science and Technology
Stephen M. Goodnick (editor), Anatoli Korkin (editor), Robert
Nemanich (editor), Springer Nature Switzerland AG 2018